EM analysis of functionally characterized synapses using inherent tissue features as fiducial markers
- Date: Feb 25, 2021
- Time: 03:00 PM (Local Time Germany)
- Speaker: Connon Thomas
- Electron microscopy facility, Max Planck Florida Institute for Neuroscience, 1 Max Planck Way, Jupiter, Florida 33458, USA
- Location: web-talk
- Room: Zoom-Meeting
- Host: Max Planck BioImaging Core Unit Network - Spotlight Talks

Connon Thomas will talk about the following publication:
Targeting Functionally Characterized Synaptic Architecture Using Inherent Fiducials and 3D Correlative Microscopy
Brain circuits are highly interconnected three-dimensional structures
fabricated from components ranging vastly in size; from cell bodies to
individual synapses. While neuronal activity can be visualized with
advanced light microscopy (LM) techniques, the resolution of electron
microscopy (EM) is critical for identifying synaptic connections between
neurons. Here, we combine these two techniques, affording the advantage
of each and allowing for measurements to be made of the same neural
features across imaging platforms. We established an EM-label-free
workflow utilizing inherent structural features to correlate in vivo
two-photon LM and volumetric scanning EM (SEM) in the ferret visual
cortex. By optimizing the volume SEM sample preparation protocol,
imaging with the OnPoint detector, and utilizing the focal charge
compensation device during serial block-face imaging, we achieved
sufficient resolution and signal-to-noise ratio to analyze synaptic
ultrastructure for hundreds of synapses within sample volumes. Our novel
workflow provides a reliable method for quantitatively characterizing
synaptic ultrastructure in functionally imaged neurons, providing new
insights into neuronal circuit organization.